R.F. Egerton - Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Brand : Springer, Binding : Taschenbuch, Edition : Softcover reprint of the original 2nd ed. 2016, Label : Springer, Publisher : Springer, PackageQuantity : 1, medium : Taschenbuch, numberOfPages : 208, publicationDate : 2018-05-30, releaseDate : 2018-05-30, authors : R.F. Egerton, ISBN : 3319819860 ...