Peter Pichler - Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)

Brand : Springer, Binding : Taschenbuch, Edition : Softcover reprint of the original 1st ed. 2004, Label : Springer, Publisher : Springer, Format : Illustriert, medium : Taschenbuch, numberOfPages : 588, publicationDate : 2012-01-11, releaseDate : 2012-01-11, authors : Peter Pichler, ISBN : 3709172047 ...